学者王靖琰 发表于2010-6-19 20:58:56 查看评论:1 │ 浏览:409 打印 推荐给朋友
Liu Yang; Rong Jin; Mummert, L.; Sukthankar, R.; Goode, A.; Bin Zheng; Hoi, S.C.H.; Satyanarayanan, M.; Pattern Analysis and Machine Intelligence, IEEE Transactions on Volume: 32 , Issue: 1 Digital Object Identifier: 10.1109/TPAMI.2008.273 Publication Year: 2010 , Page(s): 30 - 44
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